Blog

Dave Baker | April 30, 2019

Ensuring Reliable Connections in Your High-Channel-Count Systems

When investing in the development of automated test equipment (ATE), you want to be sure you are not creating a system that is difficult to modify as changes to your test requirements or devices under test (DUTs) occur. Thus, it is wise to develop a system using a common core approach that is flexible, easy to reconfigure, and can interface to multiple types of DUTs.

Dave Baker | April 17, 2019

System-Level Configuration Management for High-Channel-Count Test Systems

When it comes to high-channel-count systems, configuration management needs to be approached at a high level across the whole architecture of the system. The need for a user-friendly and organized configuration management interface is just as important as developing the software to run the tests and view results.

James Duvall | April 09, 2019

Manage Obsolescence Appropriately By Determining the Severity of Your System’s Issues

When an obsolescence issue occurs, typically the first thought is that the entire system may need to be replaced. Since a system replacement is time consuming and costly, and there is always a need to minimize downtime, quick Band-Aid-type fixes are usually performed just to get the system running again. These fixes typically do not address the underlying problems, and multiple occurrences of downtime will begin to add up. Despite common concerns that the entire system may be too old to continue, there are cheaper options than a full redesign.

Laura Barnett | April 03, 2019

April 10 LabVIEW User Group Meeting Featuring A Case Study in Automated Optical Sensor Proximity Test

Join us on April 10 at 11:30 AM for the Richardson LabVIEW user group meeting, hosted at G System's office in Richardson. During this meeting, our guest speaker, Sam Broyles, Staff Applications Engineer, ams Sensors USAwill share how he used LabVIEW for automated optical sensor proximity test. 
Ralph Hutson | March 26, 2019

Preserving Signal Integrity Through High-Quality Measurements and Signal Conditioning

Often, the act of performing a measurement on a signal can alter the signal. For example, your measurement instrument could cause extra current to flow between the device under test (DUT) and measurement tool, resulting in a signal that is slightly different than the original output.