Increase wafer probe test throughput and improve tester flexibility for use with various semiconductor sensors.
Download a white paper discussing how common core test systems are replacing proprietary legacy systems and decreasing test and development time. Download paper
To accommodate our growth, we have expanded to a new larger facility convenient to the entire DFW Metroplex. Our new address is:
G Systems, L.P. 1240 E. Campbell Road, Ste. 100 Richardson, TX 75081-1935 Tel: 972-234-6000 Fax: 972-234-6018